| 9029.20 | 010 | - Of electrical type |
| 9029.90 | 000 | Parts and accessories |
| 90.30 | | Oscilloscopes, spectrum analysers and other instruments and apparatus for measuring or checking electrical quantities, excluding meters of heading 90.28; instruments and apparatus for measuring or detecting alpha, beta, gamma, X-ray, cosmic or other ionising radiations |
| 9030.10 | 000 | Instruments and apparatus for measuring or detecting ionising radiations |
| 9030.20 | 000 | Oscilloscopes and oscillographs |
| 9030.20 | | Other instruments and apparatus, for measuring or checking voltage, current, resistance or power |
| 9030.31 | 000 | Multimeters without a recording device |
| 9030.32 | 000 | Multimeters with a recording device |
| 9030.33 | | Other, without a recording device |
| 9030.39 | 000 | Other, with a recording device |
| 9030.40 | 000 | Other instruments and apparatus, specially designed for telecommunications (for example, cross-talk meters, gain measuring instruments, distortion factor meters, psophometers) |
| 9030.82 | | For measuring or checking semiconductor wafers or devices |
| 9030.82 | 010 | - Character measuring testers |
| 9030.84 | 000 | Other, with a recording device |
| 9030.89 | 091 | - Spectrum analyzers |
| 9030.90 | 000 | Parts and accessories |
| 90.31 | | Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors |
| 9031.10 | 000 | Machines for balancing mechanical parts |
| 9031.20 | 000 | Test benches |
| 9031.20 | | Other optical instruments and appliances |
| 9031.41 | 000 | For inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices |
| 9031.80 | | Other instruments, appliances and machines |
| 9031.80 | | - Of electrical type |
Harmonized Tariff Schedule of Japans inquiry: /etc/passwd
