Harmonized Tariff Schedule | ||
---|---|---|
Statistical code | Description | |
H.S. code | Domestic code | |
9027.30 | 000 | Spectrometers, spectrophotometers and spectrographs using optical radiations (UV, visible, IR) |
9031.41 | 000 | For inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices |