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 		 Harmonized Tariff Schedule of the United States  
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Harmonized Tariff Schedule
HTS NoStat Suffix Description Unit of Quantity Rates of Duty
1 2
General Special
9030.31.0000Multimeters, without a recording deviceNo.1.7%Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG)40%
9030.32.0000Multimeters, with a recording deviceNo.1.7%Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG)40%
9030.33.00Other, without a recording device1.7%Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG)40%
9030.33.0040For measuring or checking voltage, current or resistanceX
9030.39.0100Other, with a recording deviceX1.7%Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG)40%
9030.40.0000Other instruments and apparatus, specially designed for telecommunications (for example, cross-talk meters, gain measuring instruments, distortion factor meters, psophometers)XFree40%
9030.82.0000For measuring or checking semiconductor wafers or devicesNo.Free40%
9030.84.0000Other, with a recording deviceX1.7%Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG)40%
9030.90.2500For articles of subheading 9030.10:
9030.90.6400Of instruments and apparatus of subheading 9030.82XFree40%
9030.90.8400Of instruments and apparatus of subheading 9030.82XFree40%
9030.90.8811Of articles of subheading 9030.20X
9030.90.8821Of articles of subheading 9030.31X
9030.90.8822Of articles of subheading 9030.32X
9030.90.8823Of articles of subheading 9030.33X
9030.90.8831Of articles of subheading 9030.39X
9030.90.8840Of articles of subheading 9030.40X
9030.90.8856Of articles of subheading 9030.84X
9031Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof:
9031.10.0000Machines for balancing mechanical partsX1.7%Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG)40%
9031.41.00For inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devicesFree50%
9031.41.0020For inspecting photomasks or reticles used in manufacturing semiconductor devicesNo.
9031.41.0040For inspecting semiconductor wafers or devices:
9031.49.4000Coordinate-measuring machinesNo.3.5%Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG)50%
9031.49.7000For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devicesNo.Free50%
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