| 9030.90.25 | 00 | For articles of subheading 9030.10: | | | | |
| 9030.90.25 | 00 | Printed circuit assemblies | X | 1.6% | Free (A,AU,BH,C, CA,CL,E,IL,J,JO, MA,MX,P,SG) | 40% |
| 9030.90.64 | 00 | Printed circuit assemblies: | | | | |
| 9030.90.64 | 00 | Of instruments and apparatus of subheading 9030.82 | X | Free | | 40% |
| 9030.90.84 | 00 | Of instruments and apparatus of subheading 9030.82 | X | Free | | 40% |
| 9030.90.88 | 11 | Of articles of subheading 9030.20 | X | | | |
| 9030.90.88 | 21 | Of articles of subheading 9030.31 | X | | | |
| 9030.90.88 | 22 | Of articles of subheading 9030.32 | X | | | |
| 9030.90.88 | 23 | Of articles of subheading 9030.33 | X | | | |
| 9030.90.88 | 31 | Of articles of subheading 9030.39 | X | | | |
| 9030.90.88 | 40 | Of articles of subheading 9030.40 | X | | | |
| 9030.90.88 | 56 | Of articles of subheading 9030.84 | X | | | |
| 9031 | | Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: | | | | |
| 9031.10.00 | 00 | Machines for balancing mechanical parts | X | 1.7% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | 40% |
| 9031.41.00 | | Other optical instruments and appliances: | | | | |
| 9031.41.00 | | For inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices | | Free | | 50% |
| 9031.41.00 | 20 | For inspecting photomasks or reticles used in manufacturing semiconductor devices | No. | | | |
| 9031.41.00 | 40 | For inspecting semiconductor wafers or devices: | | | | |
| 9031.41.00 | 40 | For wafers | No. | | | |
| 9031.49.40 | 00 | Coordinate-measuring machines | No. | 3.5% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | 50% |
| 9031.49.70 | 00 | For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices | No. | Free | | 50% |
| 9031.80 | | Other instruments, appliances and machines: | | | | |
| 9031.80.40 | 00 | Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles | No. | Free | | 40% |
| 9031.80.80 | 60 | Equipment for testing the characteristics of internal combustion engines: | | | | |
| 9031.80.80 | 60 | For testing electrical characteristics | X | | | |
Harmonized Tariff Schedule of the United States inquiry: 3203Ã
