| 9029 | | Revolution counters, production counters, taximeters, odometers, pedometers and the like; speedometers and tachometers, other than those of heading 9014 or 9015; stroboscopes; parts and accessories thereof: | | | | |
| 9029.10 | | Revolution counters, production counters, taximeters, odometers, pedometers and the like: | | | | |
| 9030 | | Oscilloscopes, spectrum analyzers and other instruments and apparatus for measuring or checking electrical quantities, excluding meters of heading 9028; instruments and apparatus for measuring or detecting alpha, beta, gamma, X-ray, cosmic or other ionizing radiations; parts and accessories thereof: | | | | |
| 9030.10.00 | 00 | Instruments and apparatus for measuring or detecting ionizing radiations | No. | 1.6% | Free (A,AU,BH,C, CA,CL,E,IL,J,JO, MA,MX,P,SG) | 40% |
| 9030.40.00 | 00 | Other instruments and apparatus, specially designed for telecommunications (for example, cross-talk meters, gain measuring instruments, distortion factor meters, psophometers) | X | Free | | 40% |
| 9030.82.00 | 00 | For measuring or checking semiconductor wafers or devices | No. | Free | | 40% |
| 9031 | | Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: | | | | |
| 9031.41.00 | | For inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices | | Free | | 50% |
| 9031.41.00 | 20 | For inspecting photomasks or reticles used in manufacturing semiconductor devices | No. | | | |
| 9031.41.00 | 40 | For inspecting semiconductor wafers or devices: | | | | |
| 9031.49.10 | 00 | Profile projectors | X | 2.5% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | 45% |
| 9031.49.70 | 00 | For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices | No. | Free | | 50% |
| 9031.80.40 | 00 | Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles | No. | Free | | 40% |
| 9031.80.80 | 60 | Equipment for testing the characteristics of internal combustion engines: | | | | |
| 9031.80.80 | 60 | For testing electrical characteristics | X | | | |
| 9031.90.20 | 00 | Of profile projectors | X | 2.5% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | 45% |
| 9101.11 | | Wrist watches, electrically operated, whether or not incorporating a stop watch facility: | | | | |
| 9101.19.20 | | With opto-electronic display only. | | Free | | 35% |
| 9101.91 | | Electrically operated: | | | | |
| 9101.91.20 | 00 | With opto-electronic display only | No. | Free | | 35% |
| 9102.11 | | Wrist watches, electrically operated, whether or not incorporating a stop watch facility: | | | | |
| 9102.12 | | With opto-electronic display only: | | | | |
| 9102.91 | | Electrically operated: | | | | |
| 9102.91.20 | | With opto-electronic display only | | 3.9% on the movement and case + 5.3% on the battery | Free (A,AU,BH,CA, CL,E,IL,J,J+,JO, MA,MX,P,R, SG) | 35% |
| 9103.10 | | Electrically operated: | | | | |
Harmonized Tariff Schedule of the United States inquiry: ɡ
