| 9030.31.00 | 00 | Multimeters, without a recording device | No. | 1.7% | Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG) | 40% |
| 9030.32.00 | 00 | Multimeters, with a recording device | No. | 1.7% | Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG) | 40% |
| 9030.33.00 | | Other, without a recording device | | 1.7% | Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG) | 40% |
| 9030.33.00 | 40 | For measuring or checking voltage, current or resistance | X | | | |
| 9030.39.01 | 00 | Other, with a recording device | X | 1.7% | Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG) | 40% |
| 9030.40.00 | 00 | Other instruments and apparatus, specially designed for telecommunications (for example, cross-talk meters, gain measuring instruments, distortion factor meters, psophometers) | X | Free | | 40% |
| 9030.82.00 | 00 | For measuring or checking semiconductor wafers or devices | No. | Free | | 40% |
| 9030.84.00 | 00 | Other, with a recording device | X | 1.7% | Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG) | 40% |
| 9030.90.25 | 00 | For articles of subheading 9030.10: | | | | |
| 9030.90.64 | 00 | Of instruments and apparatus of subheading 9030.82 | X | Free | | 40% |
| 9030.90.84 | 00 | Of instruments and apparatus of subheading 9030.82 | X | Free | | 40% |
| 9030.90.88 | 11 | Of articles of subheading 9030.20 | X | | | |
| 9030.90.88 | 21 | Of articles of subheading 9030.31 | X | | | |
| 9030.90.88 | 22 | Of articles of subheading 9030.32 | X | | | |
| 9030.90.88 | 23 | Of articles of subheading 9030.33 | X | | | |
| 9030.90.88 | 31 | Of articles of subheading 9030.39 | X | | | |
| 9030.90.88 | 40 | Of articles of subheading 9030.40 | X | | | |
| 9030.90.88 | 56 | Of articles of subheading 9030.84 | X | | | |
| 9031 | | Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: | | | | |
| 9031.10.00 | 00 | Machines for balancing mechanical parts | X | 1.7% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | 40% |
| 9031.41.00 | | For inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices | | Free | | 50% |
| 9031.41.00 | 20 | For inspecting photomasks or reticles used in manufacturing semiconductor devices | No. | | | |
| 9031.41.00 | 40 | For inspecting semiconductor wafers or devices: | | | | |
| 9031.49.40 | 00 | Coordinate-measuring machines | No. | 3.5% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | 50% |
| 9031.49.70 | 00 | For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices | No. | Free | | 50% |
Harmonized Tariff Schedule of the United States inquiry: t
