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 		 Harmonized Tariff Schedule of the United States  
Enter either the first part of an HTS category number up to 8 digits or any part of a product description.   　
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  719/769         
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Harmonized Tariff Schedule
HTS NoStat Suffix Description Unit of Quantity Rates of Duty
1 2
General Special
9030.90.6400Of instruments and apparatus of subheading 9030.82XFree40%
9030.90.6800OtherX1.7%Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG)40%
9030.90.8400Other:
9030.90.8400Of instruments and apparatus of subheading 9030.82XFree40%
9030.90.88Other1.7%Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG)40%
9030.90.8811Of articles of subheading 9030.20X
9030.90.8821Of articles of subheading 9030.31X
9030.90.8822Of articles of subheading 9030.32X
9030.90.8823Of articles of subheading 9030.33X
9030.90.8831Of articles of subheading 9030.39X
9030.90.8840Of articles of subheading 9030.40X
9030.90.8856Of articles of subheading 9030.84X
9030.90.8861OtherX
9031Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof:
9031.10.0000Machines for balancing mechanical partsX1.7%Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG)40%
9031.20.0000Test benchesX1.7%Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG)45%
9031.41.00Other optical instruments and appliances:
9031.41.00For inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devicesFree50%
9031.41.0020For inspecting photomasks or reticles used in manufacturing semiconductor devicesNo.
9031.41.0060OtherNo.
9031.49Other:
9031.49.4000Coordinate-measuring machinesNo.3.5%Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG)50%
9031.49.7000For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devicesNo.Free50%
9031.49.9000OtherX3.5%Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG)50%
9031.80Other instruments, appliances and machines:
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