| 9024.90.00 | 40 | Of machines and appliances for testing metals | X | | | |
| 9025.11 | | Liquid-filled, for direct reading: | | | | |
| 9026 | | Instruments and apparatus for measuring or checking the flow, level, pressure or other variables of liquids or gases (for example, flow meters, level gauges, manometers, heat meters), excluding instruments and apparatus of heading 9014, 9015, 9028 or 9032; parts and accessories thereof: | | | | |
| 9026.10 | | For measuring or checking the flow or level of liquids: | | | | |
| 9026.20 | | For measuring or checking pressure: | | | | |
| 9027 | | Instruments and apparatus for physical or chemical analysis (for example, polarimeters, refractometers, spectrometers, gas or smoke analysis apparatus); instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like; instruments and apparatus for measuring or checking quantities of heat, sound or light (including exposure meters); microtomes; parts and accessories thereof: | | | | |
| 9027.90.45 | 00 | Printed circuit assemblies for the goods of subheading 9027.80 | X | Free | | 40% |
| 9029.20.40 | 40 | For use in civil aircraft | No. | | | |
| 9030 | | Oscilloscopes, spectrum analyzers and other instruments and apparatus for measuring or checking electrical quantities, excluding meters of heading 9028; instruments and apparatus for measuring or detecting alpha, beta, gamma, X-ray, cosmic or other ionizing radiations; parts and accessories thereof: | | | | |
| 9030.10.00 | 00 | Instruments and apparatus for measuring or detecting ionizing radiations | No. | 1.6% | Free (A,AU,BH,C, CA,CL,E,IL,J,JO, MA,MX,P,SG) | 40% |
| 9030.20.05 | 00 | Specially designed for telecommunications | No. | Free | | 40% |
| 9030.31.00 | 00 | Other instruments and apparatus, for measuring or checking voltage, current, resistance or power: | | | | |
| 9030.33.00 | 40 | For measuring or checking voltage, current or resistance | X | | | |
| 9030.40.00 | 00 | Other instruments and apparatus, specially designed for telecommunications (for example, cross-talk meters, gain measuring instruments, distortion factor meters, psophometers) | X | Free | | 40% |
| 9030.82.00 | 00 | For measuring or checking semiconductor wafers or devices | No. | Free | | 40% |
| 9030.90.25 | 00 | For articles of subheading 9030.10: | | | | |
| 9031.10.00 | 00 | Machines for balancing mechanical parts | X | 1.7% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | 40% |
| 9031.41.00 | | For inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices | | Free | | 50% |
| 9031.41.00 | 20 | For inspecting photomasks or reticles used in manufacturing semiconductor devices | No. | | | |
| 9031.41.00 | 40 | For inspecting semiconductor wafers or devices: | | | | |
| 9031.41.00 | 40 | For wafers | No. | | | |
| 9031.49.70 | 00 | For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices | No. | Free | | 50% |
| 9031.80.40 | 00 | Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles | No. | Free | | 40% |
| 9031.80.80 | 60 | Equipment for testing the characteristics of internal combustion engines: | | | | |
| 9031.80.80 | 60 | For testing electrical characteristics | X | | | |
Harmonized Tariff Schedule of the United States inquiry: 3203Ã
