| 9011 | | Compound optical microscopes, including those for photomicrography, cinemicrography or microprojection; parts and accessories thereof: | | | | |
| 9011.10 | | Stereoscopic microscopes: | | | | |
| 9011.20 | | Other microscopes, for photomicrography, cinemicrography or microprojection: | | | | |
| 9011.80.00 | 00 | Other microscopes | No. | 6.4% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | 45% |
| 9012 | | Microscopes other than optical microscopes; diffraction apparatus; parts and accessories thereof: | | | | |
| 9012.10.00 | 00 | Microscopes other than optical microscopes; diffraction apparatus | X | 3.5% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | 40% |
| 9017 | | Drawing, marking-out or mathematical calculating instruments (for example, drafting machines, pantographs, protractors, drawing sets, slide rules, disc calculators); instruments for measuring length, for use in the hand (for example, measuring rods and tapes, micrometers, calipers), not specified or included elsewhere in this chapter; parts and accessories thereof: | | | | |
| 9017.30 | | Micrometers, calipers and gauges: | | | | |
| 9017.30.40 | 00 | Micrometers and calipers | No. | 5.8% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | 45% |
| 9018.31.00 | 40 | Hypodermic | No. | | | |
| 9018.50.00 | 00 | Other ophthalmic instruments and appliances and parts and accessories thereof | X | Free | | 60% |
| 9027 | | Instruments and apparatus for physical or chemical analysis (for example, polarimeters, refractometers, spectrometers, gas or smoke analysis apparatus); instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like; instruments and apparatus for measuring or checking quantities of heat, sound or light (including exposure meters); microtomes; parts and accessories thereof: | | | | |
| 9027.50.40 | 15 | Chemical analysis instruments and apparatus | No. | | | |
| 9027.50.80 | 15 | Chemical analysis instruments and apparatus | No. | | | |
| 9027.80.45 | 30 | Chemical analysis instruments and apparatus | X | | | |
| 9027.80.80 | 30 | Chemical analysis instruments and apparatus | X | | | |
| 9027.90 | | Microtomes; parts and accessories: | | | | |
| 9027.90.20 | 00 | Microtomes | No. | 2.2% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | 40% |
| 9030 | | Oscilloscopes, spectrum analyzers and other instruments and apparatus for measuring or checking electrical quantities, excluding meters of heading 9028; instruments and apparatus for measuring or detecting alpha, beta, gamma, X-ray, cosmic or other ionizing radiations; parts and accessories thereof: | | | | |
| 9030.82.00 | 00 | For measuring or checking semiconductor wafers or devices | No. | Free | | 40% |
| 9031.41.00 | | For inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices | | Free | | 50% |
| 9031.41.00 | 20 | For inspecting photomasks or reticles used in manufacturing semiconductor devices | No. | | | |
| 9031.41.00 | 40 | For inspecting semiconductor wafers or devices: | | | | |
| 9031.49.70 | 00 | For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices | No. | Free | | 50% |
| 9031.80.40 | 00 | Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles | No. | Free | | 40% |
Harmonized Tariff Schedule of the United States inquiry: 3203Ã
