| 9027 | | Instruments and apparatus for physical or chemical analysis (for example, polarimeters, refractometers, spectrometers, gas or smoke analysis apparatus); instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like; instruments and apparatus for measuring or checking quantities of heat, sound or light (including exposure meters); microtomes; parts and accessories thereof: | | | | |
| 9027.30 | | Spectrometers, spectrophotometers and spectrographs using optical radiations (ultraviolet, visible, infrared): | | | | |
| 9027.30.40 | 40 | Spectrophotometers | No. | | | |
| 9027.30.80 | 20 | Spectroscopes | No. | | | |
| 9027.80.45 | 20 | Mass spectrometers | No. | | | |
| 9029 | | Revolution counters, production counters, taximeters, odometers, pedometers and the like; speedometers and tachometers, other than those of heading 9014 or 9015; stroboscopes; parts and accessories thereof: | | | | |
| 9029.10 | | Revolution counters, production counters, taximeters, odometers, pedometers and the like: | | | | |
| 9029.20 | | Speedometers and tachometers; stroboscopes: | | | | |
| 9029.20.20 | 00 | Bicycle speedometers | No. | 6% | Free (A+,AU,BH, CA,CL,D,E,IL,J, JO,MA,MX,P,SG) | 110% |
| 9029.20.40 | | Other speedometers and tachometers | | Free | | 35% |
| 9029.20.60 | 00 | Stroboscopes | No. | 16¢/each + 2.5% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | $4.50 each + 65% |
| 9029.90.40 | 00 | Of bicycle speedometers | X | 6% | Free (A+,AU,BH, CA,CL,D,E,IL,J, JO,MA,MX,P, SG) | 110% |
| 9029.90.60 | 00 | Of stroboscopes | X | 3.2% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | 65% |
| 9029.90.80 | 40 | Of speedometers and tachometers | X | | | |
| 9030 | | Oscilloscopes, spectrum analyzers and other instruments and apparatus for measuring or checking electrical quantities, excluding meters of heading 9028; instruments and apparatus for measuring or detecting alpha, beta, gamma, X-ray, cosmic or other ionizing radiations; parts and accessories thereof: | | | | |
| 9030.20 | | Oscilloscopes and oscillographs: | | | | |
| 9030.20.05 | 00 | Specially designed for telecommunications | No. | Free | | 40% |
| 9030.20.10 | 00 | Other oscilloscopes and oscillographs | No. | 1.7% | Free (A,AU,BH,C, CA,CL,E,IL,J,JO, MA,MX,P,SG) | 40% |
| 9030.40.00 | 00 | Other instruments and apparatus, specially designed for telecommunications (for example, cross-talk meters, gain measuring instruments, distortion factor meters, psophometers) | X | Free | | 40% |
| 9031 | | Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: | | | | |
| 9031.41.00 | | For inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices | | Free | | 50% |
| 9031.41.00 | 20 | For inspecting photomasks or reticles used in manufacturing semiconductor devices | No. | | | |
| 9031.41.00 | 40 | For inspecting semiconductor wafers or devices: | | | | |
| 9031.49.70 | 00 | For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices | No. | Free | | 50% |
| 9031.80.40 | 00 | Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles | No. | Free | | 40% |
Harmonized Tariff Schedule of the United States inquiry: no
