| 6406.10.85 | 00 | Uppers of which less than 50 percent of the external surface area (including any leather, rubber or plastics accessories or reinforcements such as those mentioned in note 4(a) to this chapter) is textile materials | prs. | 4.5% | Free (A,AU,BH, CA,CL,E,IL,J, JO,MA,MX, P,SG) | 78.5% |
| 6802.10.00 | 00 | Tiles, cubes and similar articles, whether or not rectangular (including square), the largest surface area of which is capable of being enclosed in a square the side of which is less than 7 cm; artificially colored granules, chippings and powder | X | 4.8% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | 40% |
| 6802.21 | | Other monumental or building stone and articles thereof, simply cut or sawn, with a flat or even surface: | | | | |
| 6802.93.00 | 10 | Articles for monumental or building purposes of subheading 6802.23.00, not cut to size, with only one face surface-worked more than simply cut or sawn | t | | | |
| 6802.93.00 | 20 | Articles for monumental or building purposes of subheading 6802.23.00, cut to size, with one or more faces or edges surface-worked more than simply cut or sawn: | | | | |
| 6907.10.00 | 00 | Tiles, cubes and similar articles, whether or not rectangular, the largest surface area of which is capable of being enclosed in a square the side of which is less than 7 cm | m2 | 10% | Free (CA,D, E,IL,J,JO,MX,P) 4.5%(SG) 5% (AU) 5% (CL) 7.3% (MA) 7.7% (BH) | 55% |
| 6907.90.00 | 11 | Tiles, the largest surface area of which is capable of being enclosed in a square the side of which is 30 cm or less | m2 | | | |
| 6908.10 | | Tiles, cubes and similar articles, whether or not rectangular, the largest surface area of which is capable of being enclosed in a square the side of which is less than 7 cm: | | | | |
| 6908.10.20 | 00 | The largest surface area of which is less than 38.7 cm2 | m2 | 10% | Free (A*,BH,CA, CL,E,IL,J,JO, MA,MX,P) 4.5% (SG) 5% (AU) | 55% |
| 6908.90.00 | 11 | Tiles, the largest surface area of which is capable of being enclosed in a square the side of which is 30 cm or less | m2 | | | |
| 7005 | | Float glass and surface ground or polished glass, in sheets, whether or not having an absorbent, reflecting or non-reflecting layer, but not otherwise worked: | | | | |
| 7005.21 | | Colored throughout the mass (body tinted), opacified, flashed or merely surface ground: | | | | |
| 7006.00.20 | 00 | Glass, drawn or blown and not containing wire netting and not surface ground or polished | m2 | 6.4% | Free (A,AU,B,BH, CA,CL,E,IL,J, JO,MA,MX, P,SG) | 60% |
| 7228.50.10 | 20 | Of round or rectangular cross section with surfaces ground, milled or polished | kg | | | |
| 7228.50.10 | 60 | Of round or rectangular cross section with surfaces ground, milled or polished | kg | | | |
| 7321.90.20 | 00 | Top surface panels with or without burners or controls | X | Free | | 45% |
| 8460.11.00 | | Flat-surface grinding machines, in which the positioning in any one axis can be set up to an accuracy of at least 0.01 mm: | | | | |
| 8468 | | Machinery and apparatus for soldering, brazing or welding, whether or not capable of cutting, other than those of heading 8515; gas-operated surface tempering machines and appliances; parts thereof: | | | | |
| 8516.90.65 | 00 | Top surface panels with or without heating elements or controls | X | Free | | 35% |
| 8532.21.00 | 50 | Designed for surface mounting (SMD) by contact | No. | | | |
| 8532.25.00 | 45 | Designed for surface mounting (SMD) by contact | No. | | | |
| 8533.10.00 | 20 | Designed for surface mounting (SMD) by contact: | | | | |
| 8533.21.00 | 10 | Designed for surface mounting (SMD) by contact: | | | | |
| 9027 | | Instruments and apparatus for physical or chemical analysis (for example, polarimeters, refractometers, spectrometers, gas or smoke analysis apparatus); instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like; instruments and apparatus for measuring or checking quantities of heat, sound or light (including exposure meters); microtomes; parts and accessories thereof: | | | | |
| 9031.49.70 | 00 | For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices | No. | Free | | 50% |
Harmonized Tariff Schedule of the United States inquiry: 3203Ã
