| 9029.90.60 | 00 | Of stroboscopes | X | 3.2% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | 65% |
| 9029.90.80 | | Other | | Free | | 35% |
| 9029.90.80 | 40 | Of speedometers and tachometers | X | | | |
| 9029.90.80 | 80 | Other | X | | | |
| 9030 | | Oscilloscopes, spectrum analyzers and other instruments and apparatus for measuring or checking electrical quantities, excluding meters of heading 9028; instruments and apparatus for measuring or detecting alpha, beta, gamma, X-ray, cosmic or other ionizing radiations; parts and accessories thereof: | | | | |
| 9030.10.00 | 00 | Instruments and apparatus for measuring or detecting ionizing radiations | No. | 1.6% | Free (A,AU,BH,C, CA,CL,E,IL,J,JO, MA,MX,P,SG) | 40% |
| 9030.20 | | Oscilloscopes and oscillographs: | | | | |
| 9030.20.05 | 00 | Specially designed for telecommunications | No. | Free | | 40% |
| 9030.20.10 | 00 | Other oscilloscopes and oscillographs | No. | 1.7% | Free (A,AU,BH,C, CA,CL,E,IL,J,JO, MA,MX,P,SG) | 40% |
| 9030.31.00 | 00 | Other instruments and apparatus, for measuring or checking voltage, current, resistance or power: | | | | |
| 9030.31.00 | 00 | Multimeters, without a recording device | No. | 1.7% | Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG) | 40% |
| 9030.32.00 | 00 | Multimeters, with a recording device | No. | 1.7% | Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG) | 40% |
| 9030.33.00 | | Other, without a recording device | | 1.7% | Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG) | 40% |
| 9030.33.00 | 40 | For measuring or checking voltage, current or resistance | X | | | |
| 9030.33.00 | 80 | Other | X | | | |
| 9030.39.01 | 00 | Other, with a recording device | X | 1.7% | Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG) | 40% |
| 9030.40.00 | 00 | Other instruments and apparatus, specially designed for telecommunications (for example, cross-talk meters, gain measuring instruments, distortion factor meters, psophometers) | X | Free | | 40% |
| 9030.82.00 | 00 | Other instruments and apparatus: | | | | |
| 9030.82.00 | 00 | For measuring or checking semiconductor wafers or devices | No. | Free | | 40% |
| 9030.84.00 | 00 | Other, with a recording device | X | 1.7% | Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG) | 40% |
| 9030.89.01 | 00 | Other | X | 1.7% | Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG) | 40% |
| 9030.90 | | Parts and accessories: | | | | |
| 9030.90.25 | 00 | For articles of subheading 9030.10: | | | | |
| 9030.90.25 | 00 | Printed circuit assemblies | X | 1.6% | Free (A,AU,BH,C, CA,CL,E,IL,J,JO, MA,MX,P,SG) | 40% |
| 9030.90.45 | 00 | Other | X | 1.6% | Free (A,AU,BH,C, CA,CL,E,IL,J,JO, MA,MX,P,SG) | 40% |
Harmonized Tariff Schedule of the United States inquiry: 3203Ã
