¨º¡Á¨°3|¨¬¨ª?¨®¦Ì?¨º?2??D|?¨®¨¨??¨°¦Ì?1¡è??¡ã¨¹
Íâó|¡Á¡é2¨¢|¦Ì???|?¡§??




¡¡
ÃÀ¹úHTS ±àÂë(ÃÀ¹úº£¹Ø¹ØË°±àÂë)  
ÇëÊäÈëHTS±àÂëµÄÇ°°ë²¿·Ö»òÉÌÆ·ÃèÊöµÄ²¿·ÖÄÚÈÝ(Ó¢ÎÄ)   HTS ÆäËû²éѯ¹¤¾ß
    
¡¡
  1/1         
ÃÀ¹úº£¹Ø¹ØË°±àÂë
HTS ±àÂëºó ׺ ÉÌÆ·ÃèÊö ÊýÁ¿µ¥Î» ÍêË°Ë°ÂÊ
1 2
ͨ³£ Ìرð
9031.41.00Other optical instruments and appliances:
9031.41.00For inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devicesFree50%
9031.41.0020For inspecting photomasks or reticles used in manufacturing semiconductor devicesNo.
9031.41.0040For inspecting semiconductor wafers or devices:
9031.41.0040For wafersNo.
9031.41.0060OtherNo.

 1/1          

¨¨¨¨??¨®|¨®?:    ÃÀ¹úº£¹Ø±àÂë²éÕÒ     ²éѯÄÚÈÝ:  

¡Á??¨¹¨®??¡ì2¨¦?¡¥:

I want to Post a new feedback