| 9027.80.80 | 30 | Chemical analysis instruments and apparatus | X | | | |
| 9027.80.80 | 60 | Physical analysis instruments and apparatus | X | | | |
| 9027.90.45 | 00 | Of electrical instruments and apparatus: | | | | |
| 9027.90.54 | | Of instruments and apparatus of subheading 9027.20, 9027.30, 9027.50 or 9027.80 | | Free | | 40% |
| 9027.90.64 | 00 | Of optical instruments and apparatus: | | | | |
| 9027.90.64 | 00 | Of instruments and apparatus of subheading 9027.20, 9027.30, 9027.50 or 9027.80 | X | Free | | 50% |
| 9027.90.84 | 00 | Of instruments and apparatus of subheading 9027.20, 9027.30, 9027.50 or 9027.80 | X | Free | | 40% |
| 9030 | | Oscilloscopes, spectrum analyzers and other instruments and apparatus for measuring or checking electrical quantities, excluding meters of heading 9028; instruments and apparatus for measuring or detecting alpha, beta, gamma, X-ray, cosmic or other ionizing radiations; parts and accessories thereof: | | | | |
| 9030.10.00 | 00 | Instruments and apparatus for measuring or detecting ionizing radiations | No. | 1.6% | Free (A,AU,BH,C, CA,CL,E,IL,J,JO, MA,MX,P,SG) | 40% |
| 9030.20.05 | 00 | Specially designed for telecommunications | No. | Free | | 40% |
| 9030.31.00 | 00 | Other instruments and apparatus, for measuring or checking voltage, current, resistance or power: | | | | |
| 9030.40.00 | 00 | Other instruments and apparatus, specially designed for telecommunications (for example, cross-talk meters, gain measuring instruments, distortion factor meters, psophometers) | X | Free | | 40% |
| 9030.82.00 | 00 | Other instruments and apparatus: | | | | |
| 9030.90.64 | 00 | Of instruments and apparatus of subheading 9030.82 | X | Free | | 40% |
| 9030.90.84 | 00 | Of instruments and apparatus of subheading 9030.82 | X | Free | | 40% |
| 9031 | | Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: | | | | |
| 9031.41.00 | | Other optical instruments and appliances: | | | | |
| 9031.41.00 | | For inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices | | Free | | 50% |
| 9031.41.00 | 20 | For inspecting photomasks or reticles used in manufacturing semiconductor devices | No. | | | |
| 9031.41.00 | 40 | For inspecting semiconductor wafers or devices: | | | | |
| 9031.49.70 | 00 | For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices | No. | Free | | 50% |
| 9031.80 | | Other instruments, appliances and machines: | | | | |
| 9031.80.40 | 00 | Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles | No. | Free | | 40% |
| 9031.90.45 | 00 | Of other optical instruments and appliances, other than test benches: | | | | |
| 9031.90.54 | 00 | Of optical instruments and appliances of subheading 9031.41 or 9031.49.70 | X | Free | | 50% |
