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美国HTS 编码(美国海关关税编码)  
请输入HTS编码的前半部分或商品描述的部分内容(英文)   HTS 其他查询工具
    
 
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美国海关关税编码
HTS 编码后 缀 商品描述 数量单位 完税税率
1 2
通常 特别
9027Instruments and apparatus for physical or chemical analysis (for example, polarimeters, refractometers, spectrometers, gas or smoke analysis apparatus); instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like; instruments and apparatus for measuring or checking quantities of heat, sound or light (including exposure meters); microtomes; parts and accessories thereof:
9030Oscilloscopes, spectrum analyzers and other instruments and apparatus for measuring or checking electrical quantities, excluding meters of heading 9028; instruments and apparatus for measuring or detecting alpha, beta, gamma, X-ray, cosmic or other ionizing radiations; parts and accessories thereof:
9030.10.0000Instruments and apparatus for measuring or detecting ionizing radiationsNo.1.6%Free (A,AU,BH,C, CA,CL,E,IL,J,JO, MA,MX,P,SG)40%
9030.31.0000Other instruments and apparatus, for measuring or checking voltage, current, resistance or power:
9030.33.0040For measuring or checking voltage, current or resistanceX
9030.40.0000Other instruments and apparatus, specially designed for telecommunications (for example, cross-talk meters, gain measuring instruments, distortion factor meters, psophometers)XFree40%
9030.82.0000For measuring or checking semiconductor wafers or devicesNo.Free40%
9031Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof:
9031.41.00For inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devicesFree50%
9031.41.0020For inspecting photomasks or reticles used in manufacturing semiconductor devicesNo.
9031.49.4000Coordinate-measuring machinesNo.3.5%Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG)50%
9031.49.7000For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devicesNo.Free50%
9031.90.4500Bases and frames for the coordinate-measuring machines of subheading 9031.49.40X3.5%Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG)50%
9101.29.30With movement measuring not over 15.2 mm$2.28 each + 5% on the case and strap, band or braceletFree (AU,BH,CA, CL,D,E,IL,J,J+,JO, MA,MX,P, R,SG)$4.75 each + 45% on the case + 80% on the strap, band or bracelet
9101.29.40With movement measuring over 15.2 mm$1.92 each + 5% on the case and strap, band or braceletFree (AU,BH,CA,D, E,IL,J,J+,JO, MA,MX,P,R) 72¢/each + 1.8% on the case and strap, band or bracelet (CL,SG)$4.75 each + 45% on the case + 80% on the strap, band or bracelet
9102.29.25With movement measuring not over 15.2 mm:
9102.29.35With movement measuring over 15.2 mm:
9104.00.05With clock movements measuring over 50 mm in width or diameter:
9105.19.10With movement measuring not over 50 mm in width or diameter:
9105.29.10With movement measuring not over 50 mm in width or diameter:
9105.99.1000Standard marine chronometers having spring-detent escapementsNo. Jwls.17¢/each + 2.5% + 1¢/jewelFree (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P, SG)$4.50 each + 65% + 25¢/jewel
9105.99.20Other, with movement measuring not over 50 mm in width or diameter:
9106Time of day recording apparatus and apparatus for measuring, recording or otherwise indicating intervals of time, with clock or watch movement or with synchronous motor (for example, time registers, time-recorders):
9106.90.55Apparatus for measuring, recording, or otherwise indicating intervals of time, with clock or watch movements, battery powered:
9106.90.7500Apparatus for measuring, recording or otherwise indicating intervals of time, with clock or watch movements, AC powered and with opto-electronic display onlyNo.3.9%Free (A+,AU,BH, CA,CL,D,E,IL,J, JO,MA,MX, P,SG)$4.50 each + 65%

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