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美国HTS 编码(美国海关关税编码)  
请输入HTS编码的前半部分或商品描述的部分内容(英文)   HTS 其他查询工具
    
 
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美国海关关税编码
HTS 编码后 缀 商品描述 数量单位 完税税率
1 2
通常 特别
9027.80Other instruments and apparatus:
9027.80.4530Chemical analysis instruments and apparatusX
9027.80.4560Physical analysis instruments and apparatusX
9027.80.8030Chemical analysis instruments and apparatusX
9027.80.8060Physical analysis instruments and apparatusX
9027.90.4500Of electrical instruments and apparatus:
9027.90.54Of instruments and apparatus of subheading 9027.20, 9027.30, 9027.50 or 9027.80Free40%
9027.90.6400Of optical instruments and apparatus:
9027.90.6400Of instruments and apparatus of subheading 9027.20, 9027.30, 9027.50 or 9027.80XFree50%
9027.90.8400Of instruments and apparatus of subheading 9027.20, 9027.30, 9027.50 or 9027.80XFree40%
9029.20.4040For use in civil aircraftNo.
9030Oscilloscopes, spectrum analyzers and other instruments and apparatus for measuring or checking electrical quantities, excluding meters of heading 9028; instruments and apparatus for measuring or detecting alpha, beta, gamma, X-ray, cosmic or other ionizing radiations; parts and accessories thereof:
9030.10.0000Instruments and apparatus for measuring or detecting ionizing radiationsNo.1.6%Free (A,AU,BH,C, CA,CL,E,IL,J,JO, MA,MX,P,SG)40%
9030.31.0000Other instruments and apparatus, for measuring or checking voltage, current, resistance or power:
9030.40.0000Other instruments and apparatus, specially designed for telecommunications (for example, cross-talk meters, gain measuring instruments, distortion factor meters, psophometers)XFree40%
9030.82.0000Other instruments and apparatus:
9030.90.6400Of instruments and apparatus of subheading 9030.82XFree40%
9030.90.8400Of instruments and apparatus of subheading 9030.82XFree40%
9031.41.00For inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devicesFree50%
9031.41.0020For inspecting photomasks or reticles used in manufacturing semiconductor devicesNo.
9031.49.7000For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devicesNo.Free50%
9031.80.8060Equipment for testing the characteristics of internal combustion engines:
9032Automatic regulating or controlling instruments and apparatus; parts and accessories thereof:
9032.81.00Other instruments and apparatus:
9032.81.0020Industrial process control instruments and apparatus:

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