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美国HTS 编码(美国海关关税编码)  
请输入HTS编码的前半部分或商品描述的部分内容(英文)   HTS 其他查询工具
    
 
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美国海关关税编码
HTS 编码后 缀 商品描述 数量单位 完税税率
1 2
通常 特别
9030.90.2500For articles of subheading 9030.10:
9030.90.2500Printed circuit assembliesX1.6%Free (A,AU,BH,C, CA,CL,E,IL,J,JO, MA,MX,P,SG)40%
9030.90.6400Printed circuit assemblies:
9030.90.6400Of instruments and apparatus of subheading 9030.82XFree40%
9030.90.8400Of instruments and apparatus of subheading 9030.82XFree40%
9030.90.8811Of articles of subheading 9030.20X
9030.90.8821Of articles of subheading 9030.31X
9030.90.8822Of articles of subheading 9030.32X
9030.90.8823Of articles of subheading 9030.33X
9030.90.8831Of articles of subheading 9030.39X
9030.90.8840Of articles of subheading 9030.40X
9030.90.8856Of articles of subheading 9030.84X
9031Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof:
9031.10.0000Machines for balancing mechanical partsX1.7%Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG)40%
9031.41.00Other optical instruments and appliances:
9031.41.00For inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devicesFree50%
9031.41.0020For inspecting photomasks or reticles used in manufacturing semiconductor devicesNo.
9031.41.0040For inspecting semiconductor wafers or devices:
9031.41.0040For wafersNo.
9031.49.4000Coordinate-measuring machinesNo.3.5%Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG)50%
9031.49.7000For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devicesNo.Free50%
9031.80Other instruments, appliances and machines:
9031.80.4000Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticlesNo.Free40%
9031.80.8060Equipment for testing the characteristics of internal combustion engines:
9031.80.8060For testing electrical characteristicsX

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