| 9007.11.00 | | Cameras: | | | | |
| 9007.91 | | For cameras: | | | | |
| 9015 | | Surveying (including photogrammetrical surveying), hydrographic, oceanographic, hydrological, meteorological or geophysical instruments and appliances, excluding compasses; rangefinders; parts and accessories thereof: | | | | |
| 9015.40 | | Photogrammetrical surveying instruments and appliances: | | | | |
| 9015.90.00 | 40 | Of photogrammetrical surveying instruments and apparatus | X | | | |
| 9017 | | Drawing, marking-out or mathematical calculating instruments (for example, drafting machines, pantographs, protractors, drawing sets, slide rules, disc calculators); instruments for measuring length, for use in the hand (for example, measuring rods and tapes, micrometers, calipers), not specified or included elsewhere in this chapter; parts and accessories thereof: | | | | |
| 9018.11 | | Electro-diagnostic apparatus (including apparatus for functional exploratory examination or for checking physiological parameters); parts and accessories thereof: | | | | |
| 9018.19.40 | 00 | Apparatus for functional exploratory examination, and parts and accessories thereof | X | Free | | 55% |
| 9018.19.75 | 00 | Printed circuit assemblies for parameter acquisition modules | X | Free | | 35% |
| 9018.90.40 | 00 | Percussion hammers, stethoscopes and parts of stethoscopes | X | Free | | 45% |
| 9022 | | Apparatus based on the use of X-rays or of alpha, beta or gamma radiations, whether or not for medical, surgical, dental or veterinary uses, including radiography or radiotherapy apparatus, X-ray tubes and other X-ray generators, high tension generators, control panels and desks, screens, examination or treatment tables, chairs and the like; parts and accessories thereof: | | | | |
| 9022.21.00 | 00 | Apparatus based on the use of alpha, beta or gamma radiations, whether or not for medical, surgical, dental or veterinary uses, including radiography or radiotherapy apparatus: | | | | |
| 9022.90.15 | 00 | Radiation beam delivery units | X | 1.4% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | 35% |
| 9023.00.00 | 00 | Instruments, apparatus and models, designed for demonstrational purposes (for example, in education or exhibitions), unsuitable for other uses, and parts and accessories thereof | X | Free | | Free |
| 9024 | | Machines and appliances for testing the hardness, strength, compressibility, elasticity or other mechanical properties of materials (for example, metals, wood, textiles, paper, plastics), and parts and accessories thereof: | | | | |
| 9026 | | Instruments and apparatus for measuring or checking the flow, level, pressure or other variables of liquids or gases (for example, flow meters, level gauges, manometers, heat meters), excluding instruments and apparatus of heading 9014, 9015, 9028 or 9032; parts and accessories thereof: | | | | |
| 9027 | | Instruments and apparatus for physical or chemical analysis (for example, polarimeters, refractometers, spectrometers, gas or smoke analysis apparatus); instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like; instruments and apparatus for measuring or checking quantities of heat, sound or light (including exposure meters); microtomes; parts and accessories thereof: | | | | |
| 9030 | | Oscilloscopes, spectrum analyzers and other instruments and apparatus for measuring or checking electrical quantities, excluding meters of heading 9028; instruments and apparatus for measuring or detecting alpha, beta, gamma, X-ray, cosmic or other ionizing radiations; parts and accessories thereof: | | | | |
| 9030.40.00 | 00 | Other instruments and apparatus, specially designed for telecommunications (for example, cross-talk meters, gain measuring instruments, distortion factor meters, psophometers) | X | Free | | 40% |
| 9031.49.70 | 00 | For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices | No. | Free | | 50% |
| 9031.80.40 | 00 | Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles | No. | Free | | 40% |
| 9031.90.45 | 00 | Bases and frames for the coordinate-measuring machines of subheading 9031.49.40 | X | 3.5% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | 50% |
| 9104.00.05 | | With clock movements measuring over 50 mm in width or diameter: | | | | |
| 9105.19.10 | | With movement measuring not over 50 mm in width or diameter: | | | | |
| 9105.29.10 | | With movement measuring not over 50 mm in width or diameter: | | | | |
