| 9030.33.00 | | Other, without a recording device | | 1.7% | Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG) | 40% |
| 9030.39.01 | 00 | Other, with a recording device | X | 1.7% | Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG) | 40% |
| 9030.40.00 | 00 | Other instruments and apparatus, specially designed for telecommunications (for example, cross-talk meters, gain measuring instruments, distortion factor meters, psophometers) | X | Free | | 40% |
| 9030.82.00 | 00 | For measuring or checking semiconductor wafers or devices | No. | Free | | 40% |
| 9030.84.00 | 00 | Other, with a recording device | X | 1.7% | Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG) | 40% |
| 9031 | | Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: | | | | |
| 9031.41.00 | | For inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices | | Free | | 50% |
| 9031.41.00 | 20 | For inspecting photomasks or reticles used in manufacturing semiconductor devices | No. | | | |
| 9031.41.00 | 40 | For inspecting semiconductor wafers or devices: | | | | |
| 9031.49.70 | 00 | For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices | No. | Free | | 50% |
| 9031.80.40 | 00 | Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles | No. | Free | | 40% |
| 9032.10.00 | 30 | Designed for wall mounting | No. | | | |
| 9032.89.20 | 00 | Designed for use in a 6, 12 or 24 V system | X | 1.1% | Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG) | 25% |
| 9032.90.20 | 00 | Designed for use in a 6, 12 or 24 V system | X | 1.1% | Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG) | 25% |
| 9033.00.00 | 00 | Parts and accessories (not specified or included elsewhere in this chapter) for machines, appliances, instruments or apparatus of chapter 90 | X | 4.4% | Free (A,AU,B,BH, CA,CL,E,IL,J,JO, MA,MX,P,SG) | 40% |
| 9105.19.10 | | Not constructed or designed to operate for over 47 hours without rewinding | | 30￠/each + 6.9% on the case | Free (A,AU,BH,CA, CL,E,IL,J,JO,MA, MX,P,SG) | 75￠/each + 45% on the case |
| 9105.19.10 | 40 | Case Constructed or designed to operate for over 47 hours without rewinding: | No. | | | |
| 9105.29.10 | | Not constructed or designed to operate for over 47 hours without rewinding | | 20￠/each + 4.6% on the case | Free (A+,AU,BH, CA,CL,D,E,IL,J, JO,MA,MX, P,SG) | 75￠/each + 45% on the case |
| 9105.29.20 | | Constructed or designed to operate for over 47 hours without rewinding: | | | | |
| 9105.99.10 | 00 | Standard marine chronometers having spring-detent escapements | No. Jwls. | 17￠/each + 2.5% + 1￠/jewel | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P, SG) | $4.50 each + 65% + 25￠/jewel |
| 9105.99.20 | | Not constructed or designed to operate for over 47 hours without rewinding | | Free | | 75￠/each + 45% on the case |
| 9105.99.30 | | Constructed or designed to operate for over 47 hours without rewinding: | | | | |
| 9106 | | Time of day recording apparatus and apparatus for measuring, recording or otherwise indicating intervals of time, with clock or watch movement or with synchronous motor (for example, time registers, time-recorders): | | | | |
| 9106.10.00 | 00 | Time registers; time-recorders | No. Jwls. | 36￠/each + 5.6% + 2￠/jewel | Free (A+,AU,BH, CA,CL,D,E,IL, J,JO,MA,MX, P,SG) | $4.50 each + 65% + 25￠/jewel |
| 9107.00.40 | 40 | Time switches that operate on a fixed-time cycle, of a type used in household type refrigerators and combined refrigerator-freezers, to alternately control the operations of the compressor and the defrost unit (defrost timers) | No. Jwls. | | | |
