| 9030.10.00 | 00 | Instruments and apparatus for measuring or detecting ionizing radiations | No. | 1.6% | Free (A,AU,BH,C, CA,CL,E,IL,J,JO, MA,MX,P,SG) | 40% |
| 9030.31.00 | 00 | Other instruments and apparatus, for measuring or checking voltage, current, resistance or power: | | | | |
| 9030.33.00 | 40 | For measuring or checking voltage, current or resistance | X | | | |
| 9030.40.00 | 00 | Other instruments and apparatus, specially designed for telecommunications (for example, cross-talk meters, gain measuring instruments, distortion factor meters, psophometers) | X | Free | | 40% |
| 9030.82.00 | 00 | For measuring or checking semiconductor wafers or devices | No. | Free | | 40% |
| 9030.90.25 | 00 | For articles of subheading 9030.10: | | | | |
| 9030.90.64 | 00 | Of instruments and apparatus of subheading 9030.82 | X | Free | | 40% |
| 9030.90.84 | 00 | Of instruments and apparatus of subheading 9030.82 | X | Free | | 40% |
| 9030.90.88 | 11 | Of articles of subheading 9030.20 | X | | | |
| 9030.90.88 | 21 | Of articles of subheading 9030.31 | X | | | |
| 9030.90.88 | 22 | Of articles of subheading 9030.32 | X | | | |
| 9030.90.88 | 23 | Of articles of subheading 9030.33 | X | | | |
| 9030.90.88 | 31 | Of articles of subheading 9030.39 | X | | | |
| 9030.90.88 | 40 | Of articles of subheading 9030.40 | X | | | |
| 9030.90.88 | 56 | Of articles of subheading 9030.84 | X | | | |
| 9031 | | Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: | | | | |
| 9031.49.40 | 00 | Coordinate-measuring machines | No. | 3.5% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | 50% |
| 9031.49.70 | 00 | For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices | No. | Free | | 50% |
| 9031.80.40 | 00 | Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles | No. | Free | | 40% |
| 9031.90.45 | 00 | Bases and frames for the coordinate-measuring machines of subheading 9031.49.40 | X | 3.5% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | 50% |
| 9031.90.54 | 00 | Of optical instruments and appliances of subheading 9031.41 or 9031.49.70 | X | Free | | 50% |
| 9031.90.70 | 00 | Of articles of subheading 9031.80.40 | X | Free | | 40% |
| 9032.10.00 | 30 | For air conditioning, refrigeration or heating systems: | | | | |
| 9032.89.60 | 15 | Control instruments for air conditioning, refrigeration or heating systems: | | | | |
| 9032.90.60 | 60 | Of instruments and apparatus of subheading 9032.81 | X | | | |
