| 9027.50.40 | | Electrical | | Free | | 40% |
| 9027.80.45 | | Electrical | | Free | | 40% |
| 9027.80.45 | 20 | Mass spectrometers | No. | | | |
| 9027.90.45 | 00 | Of electrical instruments and apparatus: | | | | |
| 9028 | | Gas, liquid or electricity supply or production meters, including calibrating meters thereof; parts and accessories thereof: | | | | |
| 9028.30.00 | 00 | Electricity meters | No. | 16￠/each + 1.5% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | $4.50 each + 65% |
| 9028.90.00 | 40 | Of electricity meters | X | | | |
| 9030 | | Oscilloscopes, spectrum analyzers and other instruments and apparatus for measuring or checking electrical quantities, excluding meters of heading 9028; instruments and apparatus for measuring or detecting alpha, beta, gamma, X-ray, cosmic or other ionizing radiations; parts and accessories thereof: | | | | |
| 9030.10.00 | 00 | Instruments and apparatus for measuring or detecting ionizing radiations | No. | 1.6% | Free (A,AU,BH,C, CA,CL,E,IL,J,JO, MA,MX,P,SG) | 40% |
| 9030.20.05 | 00 | Specially designed for telecommunications | No. | Free | | 40% |
| 9030.31.00 | 00 | Other instruments and apparatus, for measuring or checking voltage, current, resistance or power: | | | | |
| 9030.31.00 | 00 | Multimeters, without a recording device | No. | 1.7% | Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG) | 40% |
| 9030.32.00 | 00 | Multimeters, with a recording device | No. | 1.7% | Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG) | 40% |
| 9030.33.00 | | Other, without a recording device | | 1.7% | Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG) | 40% |
| 9030.33.00 | 40 | For measuring or checking voltage, current or resistance | X | | | |
| 9030.39.01 | 00 | Other, with a recording device | X | 1.7% | Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG) | 40% |
| 9030.40.00 | 00 | Other instruments and apparatus, specially designed for telecommunications (for example, cross-talk meters, gain measuring instruments, distortion factor meters, psophometers) | X | Free | | 40% |
| 9030.82.00 | 00 | For measuring or checking semiconductor wafers or devices | No. | Free | | 40% |
| 9030.84.00 | 00 | Other, with a recording device | X | 1.7% | Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG) | 40% |
| 9031 | | Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: | | | | |
| 9031.10.00 | 00 | Machines for balancing mechanical parts | X | 1.7% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | 40% |
| 9031.41.00 | | For inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices | | Free | | 50% |
| 9031.41.00 | 20 | For inspecting photomasks or reticles used in manufacturing semiconductor devices | No. | | | |
| 9031.41.00 | 40 | For inspecting semiconductor wafers or devices: | | | | |
| 9031.49.10 | 00 | Profile projectors | X | 2.5% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | 45% |
