| 9022.21.00 | 00 | For medical, surgical, dental or veterinary uses | X | Free | | 35% |
| 9022.90.60 | 00 | Of apparatus based on the use of X-rays | X | 0.8% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | 35% |
| 9023.00.00 | 00 | Instruments, apparatus and models, designed for demonstrational purposes (for example, in education or exhibitions), unsuitable for other uses, and parts and accessories thereof | X | Free | | Free |
| 9025.11 | | Thermometers and pyrometers, not combined with other instruments: | | | | |
| 9025.11 | | Liquid-filled, for direct reading: | | | | |
| 9025.80.15 | 00 | Barometers, not combined with other instruments | No. | 1% | Free (A,AU,BH,C, CA,CL,E,IL,J,JO, MA,MX,P,SG) | 40% |
| 9027.30 | | Spectrometers, spectrophotometers and spectrographs using optical radiations (ultraviolet, visible, infrared): | | | | |
| 9027.50 | | Other instruments and apparatus using optical radiations (ultraviolet, visible, infrared): | | | | |
| 9027.90.45 | 00 | Printed circuit assemblies for the goods of subheading 9027.80 | X | Free | | 40% |
| 9029 | | Revolution counters, production counters, taximeters, odometers, pedometers and the like; speedometers and tachometers, other than those of heading 9014 or 9015; stroboscopes; parts and accessories thereof: | | | | |
| 9029.10 | | Revolution counters, production counters, taximeters, odometers, pedometers and the like: | | | | |
| 9029.20 | | Speedometers and tachometers; stroboscopes: | | | | |
| 9029.20.20 | 00 | Bicycle speedometers | No. | 6% | Free (A+,AU,BH, CA,CL,D,E,IL,J, JO,MA,MX,P,SG) | 110% |
| 9029.20.40 | | Other speedometers and tachometers | | Free | | 35% |
| 9029.90.40 | 00 | Of bicycle speedometers | X | 6% | Free (A+,AU,BH, CA,CL,D,E,IL,J, JO,MA,MX,P, SG) | 110% |
| 9029.90.80 | 40 | Of speedometers and tachometers | X | | | |
| 9030.20.05 | 00 | Specially designed for telecommunications | No. | Free | | 40% |
| 9030.40.00 | 00 | Other instruments and apparatus, specially designed for telecommunications (for example, cross-talk meters, gain measuring instruments, distortion factor meters, psophometers) | X | Free | | 40% |
| 9030.90.25 | 00 | Printed circuit assemblies | X | 1.6% | Free (A,AU,BH,C, CA,CL,E,IL,J,JO, MA,MX,P,SG) | 40% |
| 9030.90.64 | 00 | Printed circuit assemblies: | | | | |
| 9031 | | Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: | | | | |
| 9031.41.00 | | For inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices | | Free | | 50% |
| 9031.41.00 | 20 | For inspecting photomasks or reticles used in manufacturing semiconductor devices | No. | | | |
| 9031.49.70 | 00 | For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices | No. | Free | | 50% |
| 9031.80.40 | 00 | Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles | No. | Free | | 40% |
