| 9018.11.60 | 00 | Printed circuit assemblies | X | Free | | 35% |
| 9018.19.55 | 00 | Patient monitoring systems | X | Free | | 35% |
| 9018.19.75 | 00 | Printed circuit assemblies for parameter acquisition modules | X | Free | | 35% |
| 9018.19.95 | 35 | Electroencephalographs (EEG) and electromyographs (EMG) | No. | | | |
| 9018.90.68 | 00 | Printed circuit assemblies for the defibrillators of subheading 9018.90.64 | X | Free | | 35% |
| 9021.50.00 | 00 | Pacemakers for stimulating heart muscles, excluding parts and accessories thereof | No. | Free | | 35% |
| 9021.90.40 | | Parts and accessories for hearing aids and for pacemakers for stimulating heart muscles | | Free | | 35% |
| 9023.00.00 | 00 | Instruments, apparatus and models, designed for demonstrational purposes (for example, in education or exhibitions), unsuitable for other uses, and parts and accessories thereof | X | Free | | Free |
| 9026.80.40 | 00 | Heat meters incorporating liquid supply meters, and anemometers | No. | Free | | $4.50 each + 65% |
| 9026.90.40 | 00 | Of flow meters, heat meters incorporating liquid supply meters and anemometers | X | Free | | 65% |
| 9027 | | Instruments and apparatus for physical or chemical analysis (for example, polarimeters, refractometers, spectrometers, gas or smoke analysis apparatus); instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like; instruments and apparatus for measuring or checking quantities of heat, sound or light (including exposure meters); microtomes; parts and accessories thereof: | | | | |
| 9027.50.40 | 15 | Chemical analysis instruments and apparatus | No. | | | |
| 9027.50.80 | 15 | Chemical analysis instruments and apparatus | No. | | | |
| 9027.80.45 | 30 | Chemical analysis instruments and apparatus | X | | | |
| 9027.80.80 | 30 | Chemical analysis instruments and apparatus | X | | | |
| 9027.90.45 | 00 | Printed circuit assemblies for the goods of subheading 9027.80 | X | Free | | 40% |
| 9030.82.00 | 00 | For measuring or checking semiconductor wafers or devices | No. | Free | | 40% |
| 9030.90.25 | 00 | Printed circuit assemblies | X | 1.6% | Free (A,AU,BH,C, CA,CL,E,IL,J,JO, MA,MX,P,SG) | 40% |
| 9030.90.64 | 00 | Printed circuit assemblies: | | | | |
| 9031.41.00 | | For inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices | | Free | | 50% |
| 9031.41.00 | 20 | For inspecting photomasks or reticles used in manufacturing semiconductor devices | No. | | | |
| 9031.41.00 | 40 | For inspecting semiconductor wafers or devices: | | | | |
| 9031.49.70 | 00 | For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices | No. | Free | | 50% |
| 9031.80.40 | 00 | Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles | No. | Free | | 40% |
| 9032.10.00 | 30 | For air conditioning, refrigeration or heating systems: | | | | |
