| 7229.20.00 | 10 | Round, with a diameter of less than or equal to 1.6 mm, containing by weight less than 0.20 percent of carbon, more than 0.9 percent of manganese, and more than 0.6 percent of silicon, and suitable for electric arc welding: | | | | |
| 7601.20.60 | 00 | Containing 25 percent or more by weight of silicon | kg | 2.1% | Free (A+,AU,BH, CA,D,E,IL,J,JO, MA,MX, P,SG) 0.7% (CL) | 25% |
| 8480.71.40 | 00 | For the manufacture of semiconductor devices | No. | Free | | Free |
| 8486 | | Machines and apparatus of a kind used solely or principally for the manufacture of semiconductor boules or wafers, semiconductor devices, electronic integrated circuits or flat panel displays; machines and apparatus specified in Note 9 (C) to this chapter; parts and accessories: | | | | |
| 8486.20.00 | 00 | Machines and apparatus for the manufacture of semiconductor devices or of electronic integrated circuits: | No. | Free | | 35% |
| 8486.40.00 | 20 | For assembling semiconductor devices or electronic integrated circuits | No. | | | |
| 8486.40.00 | 30 | For lifting, handling, loading or unloading of boules, wafers, semiconductor devices, electronic integrated circuits and flat panel displays | No. | | | |
| 8519.81 | | Using magnetic, optical or semiconductor media: | | | | |
| 8523.51.00 | 00 | Semiconductor media: | | | | |
| 8536.69.40 | | Coaxial connectors; cylindrical multicontact connectors; rack and panel connectors; printed circuit connectors; ribbon or flat cable connectors | | Free | | 35% |
| 8536.69.40 | 20 | Cylindrical multicontact connectors | No. | | | |
| 8541 | | Diodes, transistors and similar semiconductor devices; photosensitive semiconductor devices, including photovoltaic cells whether or not assembled in modules or made up into panels; light-emitting diodes; mounted piezoelectric crystals; parts thereof: | | | | |
| 8541.40 | | Photosensitive semiconductor devices, including photovoltaic cells whether or not assembled in modules or made up into panels; light-emitting diodes: | | | | |
| 8541.50.00 | | Other semiconductor devices | | Free | | 35% |
| 9030.82.00 | 00 | For measuring or checking semiconductor wafers or devices | No. | Free | | 40% |
| 9031.41.00 | | For inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices | | Free | | 50% |
| 9031.41.00 | 20 | For inspecting photomasks or reticles used in manufacturing semiconductor devices | No. | | | |
| 9031.41.00 | 40 | For inspecting semiconductor wafers or devices: | | | | |
| 9031.49.70 | 00 | For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices | No. | Free | | 50% |
| 9031.80.40 | 00 | Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles | No. | Free | | 40% |
| 9810.00.25 | 00 | Altars, pulpits, communion tables, baptismal fonts, shrines, mosaics, iconostases, or parts, appurtenances or adjuncts of any of the foregoing, whether to be physically joined thereto or not, and statuary (except granite or marble cemetery headstones, granite or marble grave markers and granite or marble feature memorials, and except casts of plaster of Paris, or of compositions of paper or papier-m鈉h￠/ | X | Free | | Free |
