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美国HTS 编码(美国海关关税编码)  
请输入HTS编码的前半部分或商品描述的部分内容(英文)   HTS 其他查询工具
    
 
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美国海关关税编码
HTS 编码后 缀 商品描述 数量单位 完税税率
1 2
通常 特别
9018.11Electro-diagnostic apparatus (including apparatus for functional exploratory examination or for checking physiological parameters); parts and accessories thereof:
9018.19.4000Apparatus for functional exploratory examination, and parts and accessories thereofXFree55%
9018.31.0040HypodermicNo.
9018.50.0000Other ophthalmic instruments and appliances and parts and accessories thereofXFree60%
9018.90.1000Mirrors and reflectorsXFree45%
9022Apparatus based on the use of X-rays or of alpha, beta or gamma radiations, whether or not for medical, surgical, dental or veterinary uses, including radiography or radiotherapy apparatus, X-ray tubes and other X-ray generators, high tension generators, control panels and desks, screens, examination or treatment tables, chairs and the like; parts and accessories thereof:
9025Hydrometers and similar floating instruments, thermometers, pyrometers, barometers, hygrometers and psychrometers, recording or not, and any combination of these instruments; parts and accessories thereof:
9025.80.2000Hydrometers and similar floating instruments, whether or not incorporating a thermometer, non-recordingNo.2.9%Free (A,AU,BH,C, CA,CL,E,IL,J,JO, MA,MX,P,SG)85%
9027Instruments and apparatus for physical or chemical analysis (for example, polarimeters, refractometers, spectrometers, gas or smoke analysis apparatus); instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like; instruments and apparatus for measuring or checking quantities of heat, sound or light (including exposure meters); microtomes; parts and accessories thereof:
9027.50.4015Chemical analysis instruments and apparatusNo.
9027.50.8015Chemical analysis instruments and apparatusNo.
9027.80.4530Chemical analysis instruments and apparatusX
9027.80.8030Chemical analysis instruments and apparatusX
9027.90Microtomes; parts and accessories:
9027.90.2000MicrotomesNo.2.2%Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG)40%
9030Oscilloscopes, spectrum analyzers and other instruments and apparatus for measuring or checking electrical quantities, excluding meters of heading 9028; instruments and apparatus for measuring or detecting alpha, beta, gamma, X-ray, cosmic or other ionizing radiations; parts and accessories thereof:
9030.82.0000For measuring or checking semiconductor wafers or devicesNo.Free40%
9031.41.00For inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devicesFree50%
9031.41.0020For inspecting photomasks or reticles used in manufacturing semiconductor devicesNo.
9031.41.0040For inspecting semiconductor wafers or devices:
9031.49.7000For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devicesNo.Free50%
9031.80.4000Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticlesNo.Free40%
9032.89.6070Humidity control instrumentsNo.
9104.00Instrument panel clocks and clocks of a similar type for vehicles, aircraft, spacecraft or vessels:
9112Clock cases and cases of a similar type for other goods of this chapter, and parts thereof:

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