| 9021.10.00 | 50 | Bone plates, screws and nails, and other internal fixation devices or appliances | X | | | |
| 9027 | | Instruments and apparatus for physical or chemical analysis (for example, polarimeters, refractometers, spectrometers, gas or smoke analysis apparatus); instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like; instruments and apparatus for measuring or checking quantities of heat, sound or light (including exposure meters); microtomes; parts and accessories thereof: | | | | |
| 9027.30 | | Spectrometers, spectrophotometers and spectrographs using optical radiations (ultraviolet, visible, infrared): | | | | |
| 9027.50 | | Other instruments and apparatus using optical radiations (ultraviolet, visible, infrared): | | | | |
| 9029.20.40 | 40 | For use in civil aircraft | No. | | | |
| 9030.31.00 | 00 | Multimeters, without a recording device | No. | 1.7% | Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG) | 40% |
| 9030.32.00 | 00 | Multimeters, with a recording device | No. | 1.7% | Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG) | 40% |
| 9030.33.00 | | Other, without a recording device | | 1.7% | Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG) | 40% |
| 9030.39.01 | 00 | Other, with a recording device | X | 1.7% | Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG) | 40% |
| 9030.82.00 | 00 | For measuring or checking semiconductor wafers or devices | No. | Free | | 40% |
| 9030.84.00 | 00 | Other, with a recording device | X | 1.7% | Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG) | 40% |
| 9031.41.00 | | For inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices | | Free | | 50% |
| 9031.41.00 | 20 | For inspecting photomasks or reticles used in manufacturing semiconductor devices | No. | | | |
| 9031.41.00 | 40 | For inspecting semiconductor wafers or devices: | | | | |
| 9031.49.70 | 00 | For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices | No. | Free | | 50% |
| 9101.11.40 | | Having no jewels or only one jewel in the movement | | 51¡é/each + 6.25% on the case and strap, band or bracelet + 5.3% on the battery | Free (AU,BH,CA, CL,D,E,IL,J, J+,JO,MA,MX, P,R,SG) | $2.25 each + 45% on the case +80% on the strap, band or bracelet + 35% on the battery |
| 9101.19.40 | | Other, having no jewels or only one jewel in the movement | | 41¡é/each + 5% on case and strap, band or bracelet + 4.2% on the battery | Free (AU,BH,CA,D, E,IL,J,J+,JO,MA, MX,P,R,SG) 15.3¡é/each + 1.8% on the case and strap, band or bracelet + 1.5% on the battery.(CL) | $2.25 each + 45% on the case +80% on the strap, band or bracelet + 35% on the battery |
| 9101.21.10 | 00 | Having over 17 jewels in the movement: | | | | |
| 9101.29.10 | | Having no jewels or only one jewel in the movement | | 40¡é/each + 5% on the case and strap, band or bracelet | Free (AU,BH,CA, CL,D,E,IL,J,J+,JO, MA,MX,P, R,SG) | $2.25 each + 45% on the case +80% on the strap, band or bracelet |
| 9101.29.20 | | Having over 1 jewel but not over 7 jewels in the movement | | 61¡é/each + 4.4% on the case and strap, band or bracelet | Free (AU,BH,CA, CL,D,E,IL,J,J+,JO, MA,MX,P, R,SG) | $3.25 each + 45% on the case +80% on the strap, band or bracelet |
| 9101.29.30 | | Having over 7 jewels but not over 17 jewels in the movement: | | | | |
| 9101.29.70 | 00 | Having over 17 jewels in the movement: | | | | |
| 9101.91.40 | | Having no jewels or only one jewel in the movement | | Free | | $2.25 each + 45% on the case + 35% on the battery |
| 9101.99.20 | | Having no jewels or not over 7 jewels in the movement | | Free | | $2.25 each + 45% on the case |
| 9101.99.40 | | Having over 7 but not over 17 jewels in the movement: | | | | |
