| 9030.40.00 | 00 | Other instruments and apparatus, specially designed for telecommunications (for example, cross-talk meters, gain measuring instruments, distortion factor meters, psophometers) | X | Free | | 40% |
| 9030.82.00 | 00 | Other instruments and apparatus: | | | | |
| 9030.84.00 | 00 | Other, with a recording device | X | 1.7% | Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG) | 40% |
| 9030.89.01 | 00 | Other | X | 1.7% | Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG) | 40% |
| 9030.90.45 | 00 | Other | X | 1.6% | Free (A,AU,BH,C, CA,CL,E,IL,J,JO, MA,MX,P,SG) | 40% |
| 9030.90.64 | 00 | Other: | | | | |
| 9030.90.68 | 00 | Other | X | 1.7% | Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG) | 40% |
| 9030.90.84 | 00 | Other: | | | | |
| 9030.90.88 | | Other | | 1.7% | Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG) | 40% |
| 9030.90.88 | 61 | Other | X | | | |
| 9031.41.00 | | Other optical instruments and appliances: | | | | |
| 9031.41.00 | 60 | Other | No. | | | |
| 9031.49 | | Other: | | | | |
| 9031.49.70 | 00 | For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices | No. | Free | | 50% |
| 9031.49.90 | 00 | Other | X | 3.5% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | 50% |
| 9031.80 | | Other instruments, appliances and machines: | | | | |
| 9031.80.80 | | Other | | 1.7% | Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG) | 40% |
| 9031.80.80 | 70 | Other | X | | | |
| 9031.80.80 | 85 | Other | X | | | |
| 9031.90.45 | 00 | Of other optical instruments and appliances, other than test benches: | | | | |
| 9031.90.58 | 00 | Other | X | 3.5% | Free (A,AU,BH,CA, CL,E,IL,J,JO, MA,MX,P,SG) | 50% |
| 9031.90.70 | 00 | Other: | | | | |
| 9031.90.90 | | Other | | 1.7% | Free (A,AU,B,BH, C,CA,CL,E,IL,J, JO,MA,MX,P, SG) | 40% |
| 9031.90.90 | 95 | Other | X | | | |
| 9032.10.00 | 60 | Other | No. | | | |
Harmonized Tariff Schedule of the United States inquiry: no
